The following instruments are available at the X-ray Structural Characterization Facility: Rigaku SmartLab diffractometer, Bruker D8 Discover diffractometer, PANalytical Empyrean diffractometer, Rigaku D-Max/B diffractometer, Rigaku Multiflex diffractometer and, Bruker Photon 100 Single Crystal diffractometer.
Data Reduction and Analysis
Various XRD data reduction and analysis software from Rigaku, Bruker, and PANalytical, as well as molecular graphical visualization and analysis tools, are available for the facility's users. NCMN subscribes to structural databases from the International Center for Diffraction Data (ICDD) PDF–4+ and Cambridge Structural Database (CSD) for up-to-date information on inorganic and organic materials.