The SAXSpoint 5.0 is a state-of-the-art laboratory beamline for SAXS, WAXS, GISAXS, and RheoSAXS, equipped with advanced synchrotron detector technology to deliver exceptional resolution in a compact design. With Anton Paar’s high-performance SAXS system, nanostructures up to 620 nm can be precisely resolved. Offering maximum flexibility, SAXSpoint 5.0 supports the analysis of nearly any material under both ambient and non-ambient conditions. A wide range of optional features ensures readiness for future applications extending into the micrometer scale (USAXS). Powerful software solutions provide straightforward, non-destructive material characterization through automated operation and seamless data analysis.
Outstanding data quality with minimal measurement time
The SAXSpoint 5.0 utilizes an intense X-ray beam with superior spectral purity and scatterless beam collimation. With advanced microsource or MetalJet X-ray sources and high-performance optics, it achieves reliable results in remarkably short exposure times. Paired with the latest hybrid photon-counting (HPC) detectors, the system ensures precise SAXS/WAXS/GISAXS/RheoSAXS measurements for detailed analysis of nanostructured materials. This powerful configuration delivers excellent resolution, enabling the study of structures up to 620 nm, all within the most compact system of its class.
Simultaneous SAXS and WAXS data collection
The SAXSpoint 5.0 is equipped with the Slidemaster moving detector, enabling fully automated X-ray scattering measurements across an exceptionally broad q-range. This allows you to capture SAXS and WAXS data in a single run, without the need for system realignment. Simply adjust the detector to select the optimal q-range—from the highest SAXS resolution to an extended WAXS regime—for each experiment. The system also offers automatic beamstop selection and positioning. With cutting-edge EIGER2 R detectors, even windowless and beamstop-free measurements are possible.
Streamline your daily lab work
In the SAXSpoint 5.0 system, automation of routine tasks is built in to speed up the path to measurement. With the integrated Stagemaster, all X-ray components and sample stages are automatically aligned, while the system detects the installed stage and adjusts settings accordingly. This ensures optimal measurement conditions and consistently reliable results.
One system – adaptable to all experimental conditions
A wide range of Anton Paar sample stages enables the analysis of nearly any type of nanostructured material. With TrueFocus technology, switching between stages is quick and effortless, as the system automatically aligns all components. This provides exceptional flexibility and efficiency in configuring your measurement setup.
Technical Information
- TC stages: controlled-temperature studies from ambient to 350 °C
- Humidity Stage (to be added): analysis under defined RH and temperature
- GISAXS/GIXD stage: studies of nanostructured surfaces and thin films in vacuum or combined with the unique GISAXS stage 2.0, in-plane (phi) rotation module
- Quartz Cuvette 1mm for TCS: Sample holder with 1 mm quartz capillary for measurements of liquid samples.
- Pastecell N: Sample holder for the measurement of high-viscosity samples and powders
- Flowcell: Sample holder for automated SAXS measurement of liquid samples as well as for sedimenting samples and for reaction monitoring, including:
- Quartz cuvette with ETFE hoses
- Feed-through connectors
- Luer connector
- 20 syringes (1mL)
- Spare O-rings and discs
Fast results with advanced control and analysis software
The SAXSdrive™ and SAXSanalysis™ software packages streamline your workflow by automating routine tasks such as system alignment and measurement setup, while also providing powerful tools for comprehensive data analysis. Easily configure serial measurements, make use of automated sampling, perform temperature scans, and conduct time-resolved studies. Both 1D and 2D datasets can be evaluated using customizable templates, and parameters such as radius of gyration (Rg), particle size, Porod constant, specific surface area, Kratky plots, and more can be readily determined with SAXSanalysis™.