This is a state-of-the-art instrument that includes a dedicated arm for detector movement in-plane and perpendicular to the sample surface, thereby enabling the probe structure to be in both directions without tilting the sample. The instrument is equipped with cross-beam optics device hardware that will allow easy switching between focussing (BB) and parallel beam (PB) geometries. SmartLab guidance software helps the optics and sample alignment automated and prepares optimum scan conditions. The SmartLab can be configured for grazing-incidence in-plane XRD, grazing-incidence XRD, x-ray reflectivity, high-resolution XRD (rocking curves, reciprocal space maps), texture (pole figures), residual stress analysis, and small angle x-ray scattering study of nanoparticles. The diffractometer uses Cu Kalpha radiation (wavelength of about 1.54 Å).
- 3kW Cu Kα source
- Cross Beam Optics (CBO) for parallel beam and Bragg-Brentano configurations
- In-plane arm for the detector
- Scintillation Counter and D/Tex Ultra detectors
- Ge(220)x2 and Ge(220)x4 monochromator and analyzer
- 10-position sample chamber
- SAXS slit and vacuum beam path
- Guidance software for automatic alignment and measurement
- Horizontal sample mount